jedix

Jobs / job_mmb4vlfy_2yk0kj

Master Thesis - Radiation-induced gate oxide degradation in unbiased MOSFET devices (f/m/div)

idjob_mmb4vlfy_2yk0kj
typejob
pricen/a
locationonsite — Graz, Austria
statusactive
responses0
posted2026-03-03

Company: Infineon Technologies

Industry: Hardware, Semiconductors

Apply →

Master Thesis - Radiation-induced gate oxide degradation in unbiased MOSFET devices (f/m/div) at Infineon Technologies

hardwaresemiconductors
GET https://jedix.io/v1/listings/job_mmb4vlfy_2yk0kj — structured JSON

← Jobs